An Ontology Design Pattern for Historical Metrological Practices

Faculty/Professorship: Cultural Informatics  ; Digital History  
Author(s): Kremitzl, Christian  ; Schlieder, Christoph  ; Scheltjens, Werner  
Publisher Information: Bamberg : Otto-Friedrich-Universität
Year of publication: 2023
Pages: 12
Source/Other editions: Proceedings of the 13th Workshop on Ontology Design and Patterns (WOP 2022) co-located with the 21st International Semantic Web Conference (ISWC 2022) / Vojtěch Svátek, Valentina Anita Carriero, María Poveda Villalón, Christian Kindermann, Lu Zhou (Hg.). Aachen: RWTH (2022), 12 S. - ISSN: 1613-0073
Year of first publication: 2022
Language(s): English
Licence: Creative Commons - CC BY - Attribution 4.0 International 
URN: urn:nbn:de:bvb:473-irb-587794
The field of historical metrology studies past practices for measuring objects (or processes) as well as the transformations of such practices. This perspective leads to research questions that are distinctively different from those raised by the metrology for today’s natural sciences and engineering disciplines. In this paper we explain in what way published ontologies for scientific metrology fail to capture metrological practices and their transformations. We propose an ontology design pattern for modeling the practices described in historical metrological sources. We discuss the pattern’s conceptual components and link them to use cases from research in history.
GND Keywords: Ontologie; Digitale Geisteswissenschaften; Metrologie
Keywords: Ontology Design Pattern, Historical Metrology, Computational Humanities
DDC Classification: 004 Computer science  
RVK Classification: ST 515   
Type: Conferenceobject
Release Date: 26. May 2023

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