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An Ontology Design Pattern for Historical Metrological Practices
Kremitzl, Christian; Schlieder, Christoph; Scheltjens, Werner (2022): „An Ontology Design Pattern for Historical Metrological Practices“. In: Aachen: RWTH.
Faculty/Professorship:
Author:
Title of the compilation:
Proceedings of the 13th Workshop on Ontology Design and Patterns (WOP 2022) co-located with the 21st International Semantic Web Conference (ISWC 2022)
Editors:
Svátek, Vojtěch
Carriero, Valentina Anita
Villalón, MarÃa Poveda
Kindermann, Christian
Zhou, Lu
ISSN:
1613-0073
Conference:
WOP2022: 13th Workshop on Ontology Design and Patterns, October 23-24, 2022 ; Hangzhou, China
Publisher Information:
Year of publication:
2022
Pages:
Series:
CEUR Workshop Proceedings ; 3352
Language:
English
Abstract:
The field of historical metrology studies past practices for measuring objects (or processes) as well as the transformations of such practices. This perspective leads to research questions that are distinctively different from those raised by the metrology for today’s natural sciences and engineering disciplines. In this paper we explain in what way published ontologies for scientific metrology fail to capture metrological practices and their transformations. We propose an ontology design pattern for modeling the practices described in historical metrological sources. We discuss the pattern’s conceptual components and link them to use cases from research in history.
GND Keywords: ;  ; 
Ontologie
Digitale Geisteswissenschaften
Metrologie
Keywords: ;  ; 
Ontology Design Pattern
Historical Metrology
Computational Humanities
DDC Classification:
RVK Classification:
International Distribution:
Yes:
Open Access Journal:
Yes:
Type:
Conferenceobject
published:
March 16, 2023
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Question on publication
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https://fis.uni-bamberg.de/handle/uniba/58671