How Visualization PhD Students Cope with Paper Rejections






Author(s): Agarwal, Shivam  ; Latif, Shahid  ; Beck, Fabian  
Title of the compilation: IEEE Workshop Celebrating the Scientific Value of Failure (FailFest)
Year of publication: 2020
Pages: 6-10
Language(s): English
DOI: 10.1109/FailFest51498.2020.00006
Type: Contribution to an Articlecollection
URI: https://fis.uni-bamberg.de/handle/uniba/52138
Release Date: 18. November 2021