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Near Hit and Near Miss Example Explanations for Model Revision in Binary Image Classification
Finzel, Bettina; Knoblach, Judith; Thaler, Anna Magdalena; u. a. (2024): Near Hit and Near Miss Example Explanations for Model Revision in Binary Image Classification, in: Vicente Julian, David Camacho, Hujun Yin, u. a. (Hrsg.), Intelligent Data Engineering and Automated Learning – IDEAL 2024 : 25th International Conference, Valencia, Spain, November 20–22, 2024, Proceedings, Part II, Cham: Springer Nature Switzerland, S. 260–271, doi: 10.1007/978-3-031-77738-7_22.
Faculty/Chair:
Author:
Title of the compilation:
Intelligent Data Engineering and Automated Learning – IDEAL 2024 : 25th International Conference, Valencia, Spain, November 20–22, 2024, Proceedings, Part II
Editors:
Julian, Vicente
Camacho, David
Yin, Hujun
Alberola, Juan M.
Nogueira, Vitor Beires
Novais, Paulo
Tallón-Ballesteros, Antonio
Conference:
25th International Conference ; Valencia, Spain
Publisher Information:
Year of publication:
2024
Pages:
ISBN:
9783031777370
9783031777387
Language:
English
Type:
Conferenceobject
Activation date:
February 19, 2025
Permalink
https://fis.uni-bamberg.de/handle/uniba/106515