Technostress and the hierarchical levels of personality: a two-wave study with multiple data samples
Maier, Christian; Laumer, Sven; Wirth, Jakob; u. a. (2019): Technostress and the hierarchical levels of personality: a two-wave study with multiple data samples, in: European journal of information systems : EJIS ; an official journal of the Operational Research Society, London: Taylor and Francis, Jg. 28, Nr. 5, S. 496–522, doi: 10.1080/0960085X.2019.1614739.
Faculty/Chair:
Author:
 ;  ;  ; 
Title of the Journal:
European journal of information systems : EJIS ; an official journal of the Operational Research Society
ISSN:
0960-085X
1476-9344
Publisher Information:
Year of publication:
2019
Volume:
28
Issue:
5
Pages:
Language:
English
DOI:
Type:
Article
URI:
Activation date:
September 2, 2019

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Permalink https://fis.uni-bamberg.de/handle/uniba/46344