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Knowledge-Augmented Anomaly Detection in Small Lot Production for Semantic Temporal Process Data
Lin, Jianjie; Rickert, Markus; Wen, Long; u. a. (2023): „Knowledge-Augmented Anomaly Detection in Small Lot Production for Semantic Temporal Process Data“. In: New York: IEEE S. 1–8, doi: 10.1109/ETFA54631.2023.10275461.
Author:
Title of the compilation:
2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA)
Conference:
2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA) ; Sinaia, Romania
Publisher Information:
Year of publication:
2023
Pages:
ISBN:
979-8-3503-3991-8
979-8-3503-3992-5
978-8-3503-3990-1
Language:
English
Peer Reviewed:
Yes:
International Distribution:
Yes:
Type:
Conferenceobject
Activation date:
November 2, 2023
Permalink
https://fis.uni-bamberg.de/handle/uniba/91510